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1. 
Cover image for Innovations in E-learning, Instruction Technology, Assessment and Engineering Education
Innovations in E-learning, Instruction Technology, Assessment and Engineering Education
Innovations in E-learning, Instruction Technology, Assessment and Engineering Education
Author 
Iskander, Magued. editor. SpringerLink (Online service)
Call Number 
TK7867 -7867.5
ISBN 
9781402062629
Electronic Access 
Full Text Available From Springer Nature Engineering 2007 Packages
Format: 
Electronic Resources
Available:
2. 
Cover image for Point-of-Care Technologies Enabling Next-Generation Healthcare Monitoring and Management
Point-of-Care Technologies Enabling Next-Generation Healthcare Monitoring and Management
Point-of-Care Technologies Enabling Next-Generation Healthcare Monitoring and Management
Author 
Vashist, Sandeep Kumar. author. Luong, John H.T. author. SpringerLink (Online service)
Call Number 
R856 -857
ISBN 
9783030114169
Electronic Access 
Full Text Available From Springer Nature Engineering 2019 Packages
Format: 
Electronic Resources
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3. 
Cover image for Reconfigurable RF Power Amplifiers on Silicon for Wireless Handsets
Reconfigurable RF Power Amplifiers on Silicon for Wireless Handsets
Reconfigurable RF Power Amplifiers on Silicon for Wireless Handsets
Author 
Leyssenne, Laurent. author. Kerhervé, Eric. author. Deval, Yann. author. SpringerLink (Online service)
Call Number 
TK5101 -5105.9
ISBN 
9789400704251
Electronic Access 
Full Text Available From Springer Nature Engineering 2011 Packages
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Electronic Resources
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4. 
Cover image for Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
Author 
Vassighi, Arman. author. Sachdev, Manoj. author. SpringerLink (Online service)
Call Number 
TK7867 -7867.5
ISBN 
9780387297491
Electronic Access 
Full Text Available From Springer Nature Engineering 2006 Packages
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Electronic Resources
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5. 
Cover image for Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
Long-Term Reliability of Nanometer VLSI Systems Modeling, Analysis and Optimization
Author 
Tan, Sheldon. author. Tahoori, Mehdi. author. Kim, Taeyoung. author. Wang, Shengcheng. author. Sun, Zeyu. author.
Call Number 
TK7867 -7867.5
ISBN 
9783030261726
Electronic Access 
Full Text Available From Springer Nature Physics and Astronomy 2019 Packages
Format: 
Electronic Resources
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6. 
Cover image for Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security
Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security
Functional Nanostructures and Sensors for CBRN Defence and Environmental Safety and Security
Author 
Sidorenko, Anatolie. editor. Hahn, Horst. editor. SpringerLink (Online service)
Call Number 
TH9701 -9745
ISBN 
9789402419092
Electronic Access 
Full Text Available From Springer Nature Physics and Astronomy 2020 Packages
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7. 
Cover image for Practical Electronic Reliability Engineering Getting the Job Done from Requirement through Acceptance
Practical Electronic Reliability Engineering Getting the Job Done from Requirement through Acceptance
Practical Electronic Reliability Engineering Getting the Job Done from Requirement through Acceptance
Author 
Klion, Jerome. author. SpringerLink (Online service)
Call Number 
TK7867 -7867.5
ISBN 
9789401169707
Electronic Access 
Full Text Available From Springer Nature Engineering Archive Packages
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