Transmission Electron Microscopy Characterization of Nanomaterials
Título:
Transmission Electron Microscopy Characterization of Nanomaterials
ISBN:
9783642389344
Edición:
1st ed. 2014.
PRODUCTION_INFO:
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2014.
Descripción física:
IX, 717 p. 402 illus., 264 illus. in color. online resource.
Contenido:
TEM Characterization of Biological and Inorganic Nanocomposites -- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials -- TEM for Characterization of Semiconductor Nanomaterials -- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods -- TEM for Characterization of Core-Shell Nanomaterials -- Valence Electron Spectroscopy by Transmission Electron Microscopy -- TEM Characterization of Nanocomposite Materials -- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires -- Electron Microscopy for Characterization of Thermoelectric Nanomaterials -- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites -- TEM Characterization of Metallic Nanocatalysts -- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures.
Síntesis:
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
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