Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization
Título:
Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization
ISBN:
9783319753775
Edición:
1st ed. 2018.
PRODUCTION_INFO:
Cham : Springer International Publishing : Imprint: Springer, 2018.
Descripción física:
XX, 594 p. 336 illus., 266 illus. in color. online resource.
Serie:
Springer Series in Optical Sciences, 212
Contenido:
Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
Síntesis:
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
Autor corporativo añadido:
Acceso electrónico:
Full Text Available From Springer Nature Physics and Astronomy 2018 Packages
Idioma:
Inglés