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Statistical Methods for Data Analysis in Particle Physics
Titre:
Statistical Methods for Data Analysis in Particle Physics
ISBN (Numéro international normalisé des livres):
9783319628400
Auteur personnel:
Edition:
2nd ed. 2017.
PRODUCTION_INFO:
Cham : Springer International Publishing : Imprint: Springer, 2017.
Description physique:
XVI, 257 p. 101 illus., 97 illus. in color. online resource.
Collections:
Lecture Notes in Physics, 941
Table des matières:
Preface -- Probability theory -- Probability Distribution Functions -- Bayesian Approach to Probability -- Random Numbers and Monte Carlo Methods -- Parameter Estimate -- Combining Measurements -- Confidence Intervals -- Convolution and Unfolding -- Hypothesis Tests -- Discoveries and Upper Limits -- Index.
Extrait:
This concise set of course-based notes provides the reader with the main concepts and tools needed to perform statistical analyses of experimental data, in particular in the field of high-energy physics (HEP). First, the book provides an introduction to probability theory and basic statistics, mainly intended as a refresher from readers' advanced undergraduate studies, but also to help them clearly distinguish between the Frequentist and Bayesian approaches and interpretations in subsequent applications. More advanced concepts and applications are gradually introduced, culminating in the chapter on both discoveries and upper limits, as many applications in HEP concern hypothesis testing, where the main goal is often to provide better and better limits so as to eventually be able to distinguish between competing hypotheses, or to rule out some of them altogether. Many worked-out examples will help newcomers to the field and graduate students alike understand the pitfalls involved in applying theoretical concepts to actual data. This new second edition significantly expands on the original material, with more background content (e.g. the Markov Chain Monte Carlo method, best linear unbiased estimator), applications (unfolding and regularization procedures, control regions and simultaneous fits, machine learning concepts) and examples (e.g. look-elsewhere effect calculation).  .
Auteur collectif ajouté:
Langue:
Anglais