Imagem da capa para Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012
Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012
Título:
Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012
ISBN:
9781461445876
Edição:
1st ed. 2013.
PRODUCTION_INFO:
New York, NY : Springer New York : Imprint: Springer, 2013.
Descrição Física:
X, 294 p. online resource.
Conteúdo:
Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
Resumo:
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.  Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Autor Corporativo Adicionado:
LANGUAGE:
Inglês