Scanning Probe Microscopy Techniques -- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids -- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy -- Polarization-Sensitive Tip-Enhanced Raman Scattering -- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes -- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics -- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity -- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter -- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope -- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy -- Characterization -- Simultaneous Topography and Recognition Imaging -- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM -- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules -- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices -- Quantized Mechanics of Nanotubes and Bundles -- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials -- Mechanical Properties of One-Dimensional Nanostructures -- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale -- Controlling Wear on Nanoscale -- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping -- Industrial Applications -- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture -- Near-Field Optical Litography -- A New AFM-Based Lithography Method: Thermochemical Nanolithography -- Scanning Probe Alloying Nanolithography -- Structuring the Surface of Crystallizable Polymers with an AFM Tip -- Application of Contact Mode AFM to Manufacturing Processes -- Scanning Probe Microscopy as a Tool Applied to Agriculture.