Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012 için kapak resmi
Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012
Başlık:
Nyquist AD Converters, Sensor Interfaces, and Robustness Advances in Analog Circuit Design, 2012
ISBN:
9781461445876
Edition:
1st ed. 2013.
Yayın Bilgileri:
New York, NY : Springer New York : Imprint: Springer, 2013.
Fiziksel Tanımlama:
X, 294 p. online resource.
Contents:
Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
Abstract:
This book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.  Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
Dil:
English