Software-Based Self-Test for Delay Faults -- On Test Generation for Microprocessors for Extended Class of Functional Faults -- Robust FinFET Schmitt Trigger Designs for Low Power Applications -- An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults -- Process Variability Impact on the SET Response of FinFET Multi-level Design -- Efficient Soft Error Vulnerability Analysis Using Non-Intrusive Fault Injection Techniques -- A Statistical Wafer Scale Error and Redundancy Analysis Simulator -- Hardware-enabled Secure Firmware Updates in Embedded Systems -- Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient Performance -- Security Aspects of Real-time MPSoCs: The Flaws and Opportunities of Preemptive NoCs -- Offset-Compensation Systems for Multi-Gbit/s Optical Receivers -- Accelerating Inference on Binary Neural Networks with Digital RRAM Processing -- Semi- and Fully-Random Access LUTs for Smooth Functions -- A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors -- Exploiting Heterogeneous Mobile Architectures through a Unified Runtime Framework.