Fundamentals of MCM Testing and Design-for-Testability -- Die Level Testing -- Known Good Die -- Substrate Testing -- A Survey of Test Techniques for MCM Substrates -- Smart Substrate MCMs -- Electron Beam Probing-A Solution for MCM Test and Failure Analysis -- Module Level Test -- MCM Test Strategy Synthesis from Chip Test and Board Test Approaches -- Designing "Dual Personality" IEEE 1149.1 Compliant Multi-Chip Modules -- An Effective Multi-Chip BIST Scheme -- MCM Test Applications -- Design-for-Test in a Multiple Substrate Multichip Module -- A Test Methodology for High Performance MCMs -- Module Level Diagnosis -- A Formalization of the IEEE 1149.1-1990 Diagnostic Methodology as Applied to Multichip Modules -- Multichip Module Diagnosis by Product-Code Signatures -- Simulation Techniques for MCMs -- Simulation Techniques for the Manufacturing Test of MCMs -- MCM Test Economics -- Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.