Developments in Applied Artificial Intelligence 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Laughborough, UK, June 23-26, 2003, Proceedings için kapak resmi
Developments in Applied Artificial Intelligence 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Laughborough, UK, June 23-26, 2003, Proceedings
Başlık:
Developments in Applied Artificial Intelligence 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, Laughborough, UK, June 23-26, 2003, Proceedings
ISBN:
9783540450344
Edition:
1st ed. 2003.
Yayın Bilgileri:
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2003.
Fiziksel Tanımlama:
XXVIII, 1232 p. online resource.
Series:
Lecture Notes in Artificial Intelligence, 2718
Contents:
System Integration -- Genetic Algorithms -- Vision and Signal Analysis -- Intelligent Systems -- Learning -- Data Mining -- Knowlede Management -- Modelling -- Vision -- Neural Networks -- Knowledge Based System -- Reasoning -- Agent Based Systems -- Machine Learning -- Intelligent Systems -- Neural Networks -- Data Mining -- Heuristic Search -- Genetic Algorithms -- Robotics -- Problem Solving -- Speech -- Genetic Algorithms -- GIS Systems.
Abstract:
This book constitutes the refereed proceedings of the 16th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 2003, held in Loughborough, UK in June 2003. The 81 revised full papers presented were carefully reviewed and selected from more than 140 submissions. Among the topics addressed are soft computing, fuzzy logic, diagnosis, knowledge representation, knowledge management, automated reasoning, machine learning, planning and scheduling, evolutionary computation, computer vision, agent systems, algorithmic learning, tutoring systems, financial analysis, etc.
Dil:
English